
E-LIT - Electronic / Semiconductor Testing Solution
E-LIT - Lock-In Thermography for Electronics is an automated test solution system (part of the NDT techniques) that allows failure analysis
E-LIT - Lock-In Thermography for Electronics is an automated test solution system (part of the NDT techniques) that allows failure analysis
ImageIR® 8300 - precise, reliable and efficient As the performance of electronic components increases, the demand for thermal management
Thermography in MEMS Microactuator Research Microelectromechanical systems (MEMS) offer a wide range of potential applications in nanotechnology. From
Thermography for high-performance electronic systems The energy efficiency of electronic components is becoming increasingly important in many application areas. And
Getting electronical components into focus One of the major developments in electronics design today is size reduction. But there is no
The combination of measurement results from digital image correlation (ARAMIS, DIC) and temperature measurement data from infrared cameras
The various welding tasks in steel constructions currently have a low degree of automation, which results in a high amount of manual work
The LAC of the University of Aalen, in collaboration with its industrial partner Conntronic Prozess- und Automatisierungstechnik GmbH from Augsburg, is investigating capillary laser brazing at
Analysis of passive components with the temperature oscillation method Technical systems and devices are often subject to the influence of thermal energy or
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